Panalytical Aeris Research Edition

High power x-ray option

Speed & Sensitivity Pack

Full ICDD PDF Library

Two instruments for redundancy and capacity

X-ray Diffraction or XRD provides a compound based description of a material. The material must be crystalline in structure for XRD to measure. Most non-organic materials are crystalline and measureable.

Amorphous or non-crystaline materials can be measured as a percentage of the material.

SEMx has a huge variety of sample holders. We can measures samples as small as a single grain. Samples that cannot have the material to measured removed can be scanned on irregular sample holders. It is very rare that we cannot mount a sample for measurement.