Research Grade with two operation modes (High & Low vacuum modes): High resolution imaging for both conductive and nonconductive samples. High Vacuum resolution = 3.0nm at 30KV, Low Vacuum = 4.0nm at 30KV. Magnification = 5X to 300,000X at 300V to 30KV
High & Low Vacuum Secondary Electron Detectors: Enhanced performance, deliver high resolution secondary electron images in both operation modes.
Backscattered Electron Detector: Provides composition data, topographic and variable shadow imaging
X-Ray Analysis – EDS, Elemental Mapping and Line Scan : (see EDS page)
High resolution digital acquisition: imaging up to 5120 X 3840 pixels (4K is typically 3840 X 2160).
Large Vacuum Chamber: Large, irregularly-shaped samples can be viewed without destruction. Sample can be as large as 300mm in diameter and 80mm in height.
Five axis: X, Y, Z with T (10°-90° Tilt) & R (360° Rotation)
Video Sample Navigation: enables observation inside chamber. Image can be stored and recalled for future navigation.SEM takes over when optical microscopes cannot provide further magnification or disern the differences between materials or structures.
A well tuned SEM can magnify up to 300,000 times. These images are high definition and in greyscale providing incredible detail.
Backscatter sensors show images based on the density of the material. These images provide indication of inconsistencies in materials.
The SEM that SEMx owns is very current, highly maintained, feature rich and operated at the highest level of skill and professionalism.
